High-Magnification Observation Microscope FS-70

High-Magnification Observation Microscope FS-70

The FS-70 series microscope offers versatile observation modes, suitable for examining metals, semiconductors, LCDs, resins, and other materials. This series is equipped with three optical channels and is compatible with YAG lasers (near-infrared, visible, near-ultraviolet, or ultraviolet) for micro-processing tasks such as cutting, trimming, IC circuit repair, and color filter restoration. Additionally, the FS-70 series supports infrared optical systems, making it ideal for inspecting inside silicon wafer packages and analyzing spectral properties. It also features a highly operable multi-lens turret design and long working-distance objectives. The FS-70 microscope is an ideal choice for semiconductor substrate probe stations.